Eddy current device for automatically testing the quality of elo

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

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324240, G01R 3300

Patent

active

042097444

ABSTRACT:
An automatic eddy current inspection system for discrimination of defects in elongated parts made of conducting materials comprises an alternating current generator connected in series to an amplitude selector via a differential encircling eddy-current transducer and a detector. The amplitude selector has two selection levels. The system also comprises a signal analyzer with a controllable switch and the following counters: a counter for determining the length of long cracks; a minor defects counter; a major defects counter; and a counter for determining the length of tested parts. The outputs of the counters are connected to the inputs of a sorter having its outputs connected to quality grade indicators. The controllable switch of the signal analyzer has its control input connected to the output of the amplitude selector which corresponds to a higher selection level. The input of the counter for determining the length of long cracks is connected to the output of a long cracks detecting circuit which has three inputs. The first input of said circuit is connected to a "part length-code" transducer, while its second and third inputs are connected to the inputs of the amplitude selector. The input of the minor defects counter and the input of the major defects counter are connected to respective outputs of an inhibitor which has three inputs connected as follows: the first one is connected in series to the control circuit of the controllable switch of the signal analyzer; the second one is connected to the output of the amplitude selector which corresponds to a higher selection level; and the third one, control, is connected to the output of the long cracks detecting unit. The input of the counter for determining the length of tested parts is connected to the output of the "part length-code" transducer.

REFERENCES:
patent: 2300999 (1942-11-01), Williams
patent: 3056681 (1962-09-01), Hochschild
patent: 3343079 (1967-09-01), Cronch
patent: 3394303 (1968-07-01), Cressman et al.
patent: 3528003 (1970-09-01), Forster
patent: 3538433 (1970-11-01), Wood et al.
patent: 3895290 (1975-07-01), Audenard et al.
Gunkel, W. A., A Method for Defect Discrimination etc., Material Eval., Feb. 1964, pp. 80-85.
Stumm, W., New Development In E. C. Testing etc., Material Eval., Jul. 1971, pp. 141-147.

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