Eddy-current defect test instrument with multiple test probes an

Details Eddy-current defect test instrument with multiple test probes an Eddy-current defect test instrument with multiple test probes an

1991-01-29

1993-02-02

Snow, Walter E.

Electricity: measuring and testing

Magnetic

With compensation for test variable

324238, 324262, G01R 3312, G01N 2772, G01N 2782

Patent

active

051840707

ABSTRACT:
An eddy-current defect test instrument with a rotary head (30) and test probes (32, 34, 36, 38) offset-mounted along a circular track (66) with only one distance probe (40) to achieve compensation for variations in spacing between the probes and the workpiece which only requires one distance signal processing device (60) and only one rotary transmitter (100). This is accomplished by storing the control signals obtained from the distance probe during one revolution of the rotary head (30) and retrieving those control signals associated with the probe position and appropriately modifying a defect signal.

REFERENCES:
patent: 4792755 (1988-12-01), Huschelrath et al.

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