Echometer for locating defects which affect light conductors

Details Echometer for locating defects which affect light conductors Echometer for locating defects which affect light conductors

1982-06-28

1989-05-02

McGraw, Vincent P.

Optics: measuring and testing

For optical fiber or waveguide inspection

G01N 2188

Patent

active

048263141

ABSTRACT:
An echometer which translates an optical signal into the centimetric or decimetric wave bands. A test signal and the local oscillator signal are provided by a single laser oscillator. The test signal and the local oscillator signal, which are 90.degree. different in phase, are modulated at centimetric or decimetric frequencies, and detected by mixing echo signals and the local oscillator signal with a photodiode or the like.

REFERENCES:
patent: 4012149 (1977-03-01), Bouillie et al.

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