Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1999-01-07
1999-10-26
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356305, G01J 318
Patent
active
059737808
ABSTRACT:
An echelle spectroscope has one or more echelle diffraction gratings, one or more elements for separating dispersed light into portions corresponding to different orders of diffraction and one or more imaging means such as imaging mirrors but there is only one image detector. These components are so designed and arranged with respect to one another that the total range of wavelength to be analyzed is divided into a plurality of smaller ranges and the portions of the spectral light from a source corresponding to different ones of these divided wavelength ranges travel on different paths but would each form an image on the same image detector. A shutter is provided so as to selectively allow one of these portions of spectral light corresponding to one of different wavelength ranges to pass through.
REFERENCES:
patent: 5565983 (1996-10-01), Barnard
Oogishi Fumikazu
Tsuboi Naohiro
Evans F. L.
Shimadzu Corporation
LandOfFree
Echelle spectroscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Echelle spectroscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Echelle spectroscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-770533