Echelle spectrometer with a shaped oriented slit

Details Echelle spectrometer with a shaped oriented slit Echelle spectrometer with a shaped oriented slit

1996-09-26

1998-02-17

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01J 304, G01J 318

Patent

active

057196729

ABSTRACT:
An improved echelle spectrometer comprises a slit in light blocking plate, an echelle grating, and a detector array. The slit is shaped and oriented to align an image of a light beam projected through the slit, onto the echelle grating and onto the detector in a desired orientation and shape relative to the detector array. Precise adjustment of the shape and orientation of the slit is dependent on the orientation of the detector with respect to the dispersion direction of the echelle grating. The echelle spectrometer provides high detector resolution with reduced read-out time.

REFERENCES:
patent: 5088823 (1992-02-01), Smith, Jr. et al.
patent: 5473427 (1995-12-01), Riley et al.

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