Image analysis – Applications – Manufacturing or product inspection
Patent
1995-08-02
1998-12-29
Boudreau, Leo
Image analysis
Applications
Manufacturing or product inspection
382152, 382288, 356 731, G06K 900, G06K 936, G01B 1124
Patent
active
058548521
ABSTRACT:
An offset determination system and method permit accurate calculation of an offset of a central feature of an object. The offset determination system and method are particularly suited for, but not limited to, an automatic inspection system for determining the eccentricity of an optical fiber core relative to a theoretical ideal center of an optical fiber termination. The core is extremely smaller (typically between about 50 and 500 times) in size than the termination boundary. An inspection system has a feature imager, one or more boundary segment imagers but preferably four in number, and a machine vision system connected to the foregoing imagers. The feature imager is positioned to capture an image of the feature (e.g., fiber core endface), and the one or more boundary segment imagers are positioned to capture an image of a corresponding boundary segment of the object (e.g., termination endface). The machine vision system determines the offset, or eccentricity, based upon the feature image, the one or more boundary segment images, and the offset determination system and method.
REFERENCES:
patent: 5367372 (1994-11-01), DiVita et al.
patent: 5408309 (1995-04-01), Shimada et al.
Norland, Eric A., "Defining and Measuring Physical Parameters of PC Polished Connectors," The 10th Annual National Fiber Optic Engineers Conference, San Diego, CA, Jun. 12-16, 1994, pp. 259-265.
Harding, Kevin et al., "Light Engineering for Machine Vision: Techniques and Applications," Part 1 and Part 2, Mar. 2-3, 1994, Ann Arbor, Michigan, Manufacturing Engineering Certification Institute sponsored by SME.
Csipkes Andrei
Palmquist John Mark
Boudreau Leo
Lucent Technologies - Inc.
Mehta Bhavesh
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