Easily testable semiconductor LSI device

Details Easily testable semiconductor LSI device Easily testable semiconductor LSI device

1987-03-23

1989-03-14

Miller, Stanley D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307243, 307465, 307468, 371 24, 371 74, H03K 1756, H03K 1716, G01R 3128

Patent

active

048126780

ABSTRACT:
In a large scale integrated (LSI) circuit, a through-passage circuit together with a selector circuit is provided between an input circuit and an output circuit, thereby enabling to selectively short-circuit the input circuit to the output circuit. In testing a complex circuit including two or more such LSIs, the internal circuit of the LSIs can be selectively extremely simplified to enable easy and fast testing.

REFERENCES:
patent: 4561094 (1985-12-01), Vackowski et al.

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