E-O probe

Details E-O probe E-O probe

1993-09-09

1996-03-19

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Using radiant energy

324753, 324752, 359247, 359248, 359263, G01R 3100

Patent

active

055005870

ABSTRACT:
An E-O probe with improved spatial resolution has a light transmissive base part, an electro-optic material which is fixed to the base part and has an index of refraction which varies in response to an electrical field from a measured object, and a mirror which is fixed to the electro-optic material and reflects an incident beam penetrating the base part and the electro-optic material. The mirror is formed to be smaller than the incident beam in diameter. The electro-optic material is formed very thin.

REFERENCES:
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4864220 (1989-09-01), Aoshima et al.
patent: 4873485 (1989-10-01), Williamson
patent: 4982151 (1991-01-01), Takahashi et al.
patent: 4996475 (1991-02-01), Takahashi et al.
de Kort et al., "Waveform Measurements with Calibrated Amplitude by Electro-Optic Sampling in IC's," Microelectronic Engineering 16 (1992), 341-348.

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