Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Patent
1993-10-13
1995-09-26
Chilcot, Jr., Richard E.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
73808, 73856, G01D 300
Patent
active
054526140
ABSTRACT:
Phase delay, amplitude and the like of sinusoidal strain (stress) are detected with high precision, and also adverse influences caused by expansion, shrinkage, stress relaxation, and creep of a sample are removed by a simple correction term by way of a mathematical method, utilizing Fourier transformation processing. A digital-to-analog converter is used for converting a signal of a detector for detecting sample strain, or displacement of the sample, a memory is connected for storing a digital output signal from the analog-to-digital converter, and a calculator is used for performing a Fourier transformation calculation on the signal values stored in the memory. Complex elastic modulus M* and loss tangent tan .delta. corresponding to the basic physical amount in dynamic viscoelasticity can be obtained with high precision by processing a response signal derived from the sample by Fourier transformation processing. Also, the measuring range of the elastic modulus can be expanded.
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Kato Hidetaka
Nakamura Nobutaka
Chilcot Jr. Richard E.
Noori Max H.
Seiko Instruments Inc.
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