Dynamic testing of electrical conductors

Details Dynamic testing of electrical conductors Dynamic testing of electrical conductors

1983-01-05

1984-11-20

Yasich, Daniel M.

Thermal measuring and testing

Thermal testing of a nonthermal quantity

Of susceptibility to thermally induced deteriouration, flaw,...

324 65R, G01N 2714, G01R 2702

Patent

active

044836295

ABSTRACT:
A technique is described that permits direct and accurate evaluation of a thin film conductor's reliability which requires only a few hours to carry out. The technique involves a temperature ramp procedure which dynamically exposes a conductor operating under constant current stress to a linear (in time) rise in temperature. Changes in resistivity of the conductor provides kinetic data that is directly related to both the electromigration process and the reliability of the device.

REFERENCES:
patent: 3266290 (1966-08-01), Haacke
patent: 3279239 (1966-10-01), Arends et al.
patent: 3414811 (1968-12-01), Carter
patent: 3474530 (1969-10-01), Ainslie et al.
patent: 3572092 (1971-03-01), Zernow
patent: 3958176 (1976-05-01), Kraeutle
"Measurement of Thermal Diffusivity Using a Pyroelectric Detector", C. E. Yeack et al., J. Appl. Phys. 53 (6) (Jun. 1982), pp. 3947-3949.
The Effect of Hydrogen Ambient on Electromigration in Al and Al--Cu Thin Films--George Sardo, Syracuse University 1979.

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