Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-09-28
2000-06-20
Williams, Hezron
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
738659, 738655, 324765, G01R 3128, G06F 1520
Patent
active
060781890
ABSTRACT:
A method of dynamically modifying a test program makes testing more efficient and less costly while avoiding errors from manual operations. In one embodiment the order of functional tests in the test program is dynamically changed based on the results of testing. Tests that have caused fails are moved earlier in the testing program without having to recompile the test program. Each functional test has an initialization step to set the chip in a state from which subsequent test vectors are run.
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patent: 5654632 (1997-08-01), Ohno
"A Logic Design Strcuture for LSI Testing" E. Eichelberger & T. W. Williams, 14th Design Automation Conference, Jun. 1977, p. 462-468.
International Business Machines - Corporation
Leas James M.
Wiggins J. David
Williams Hezron
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