Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1977-02-02
1978-12-26
Clawson, Jr., Joseph E.
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
357 23, 357 51, 357 59, 307238, 365182, 365185, H01L 2702
Patent
active
041319060
ABSTRACT:
A dynamic Random Access Memory consisting of pairs of adjacent one transistor/one capacitor memory cells. The gate electrodes of the MOS FETs in each pair of adjacent memory cells are coupled and further connected to an address line at only a single contact hole. There is also disclosed a method for manufacturing the dynamic Random Access Memory with a high integration density. The gap between one electrode of the capacitor and the MOS FET is minimized by converting the end portion of the capacitor electrode to a thin insulating film.
REFERENCES:
patent: 3771147 (1973-11-01), Boll et al.
patent: 3811076 (1974-05-01), Smith
patent: 4003034 (1977-01-01), Au
patent: 4012757 (1977-03-01), Koo
patent: 4041519 (1977-08-01), Melen
Clawson Jr. Joseph E.
Tokyo Shibaura Electric Co. Ltd.
LandOfFree
Dynamic random access memory using MOS FETs and method for manuf does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dynamic random access memory using MOS FETs and method for manuf, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic random access memory using MOS FETs and method for manuf will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1131478