Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2005-11-16
2009-02-24
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
Reexamination Certificate
active
07496474
ABSTRACT:
An apparatus and a method for analyzing signals within an integrated circuit are described. In one embodiment of the present invention, internal IC signals are tapped, sampled and stored according to one or more sampling criteria. The signals may be taken from multiple locations within the IC and the information stored may include data, timing information, control data and other such information related to the tapped signals. The stored information may be provided to an external device for analysis.
REFERENCES:
patent: 6389558 (2002-05-01), Herrmann et al.
patent: 7051239 (2006-05-01), Litt
patent: 2003/0097615 (2003-05-01), Corti et al.
patent: 2004/0054815 (2004-03-01), Carlton, III
patent: 2006/0156290 (2006-07-01), Johnson et al.
Browen Adam S.
Chafin Craig
Olson Steve A.
Whitt Jeffery K.
LSI Corporation
Nghiem Michael P
North Weber & Baugh LLP
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