Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1991-10-25
1993-08-24
McGraw, Vincent P.
Optics: measuring and testing
By particle light scattering
With photocell detection
356346, 359876, G01B 902, G01N 2135, G02B 2610
Patent
active
052393615
ABSTRACT:
An interferometer mirror such as may be used in an FTIR spectrometer is mounted to a mirror alignment device which allows alignment of the mirror during operation of the interferometer. The alignment device includes a base, a mirror support to which the mirror is mounted, and means for mounting the mirror support to the base to allow resilient pivoting of the mirror about an initial position around two orthogonal axes when force is applied to the mirror support. Two drive coils of square configuration are mounted around the periphery of the mirror support. Each drive coil has lower coil sections along two opposite quadrants and higher coil sections, with the two drive coils being mounted to the mirror supports so that the lower sections of each are in adjacent quadrants. A magnetic field, such as that provided by permanent magnets, is applied to the lower sections of each coil while the upper sections of each coil are outside the magnetic field. When current is supplied in one direction to a drive coil, the current interacts with the magnetic field passing through the lower sections of the coil to tilt the mirror support about one axis of rotation in one direction, whereas current supplied to the coil in the opposite direction will tilt the magnet support in the opposite direction about the axis. In this manner, current can be supplied to the two coils as necessary to hold the mirror support and thus the mirror attached to it in a desired orientation.
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McGraw Vincent P.
Nicolet Instrument Corporation
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