Optical communications – Diagnostic testing – Determination of communication parameter
Reexamination Certificate
2006-04-04
2006-04-04
Sedighian, M. R. (Department: 2633)
Optical communications
Diagnostic testing
Determination of communication parameter
C398S026000, C398S027000, C398S028000, C398S029000, C398S202000, C398S212000, C398S208000
Reexamination Certificate
active
07024111
ABSTRACT:
Apparatus and method is described for using a silicon photon-counting avalanche photodiode (APD) to detect at least two-photon absorption (TPA) of an optical signal, the optical signal having a wavelength range extending from 1.2 μm to an upper wavelength region that increases as the number of photons simultaneously absorbed by the APD increases beyond two. In one embodiment, the TPA count is used by a signal compensation apparatus to reduce dispersion of a received optical pulse communication signal subjected to group velocity dispersion, polarization mode dispersion, or other signal impairment phenomena which effect the TPA count. Another embodiment, the TPA count is used to determine the optical signal-to-noise ratio of a received optical pulse communication signal. Another embodiment uses the TPA count to determine the autocorrelation between a first and second optical pulse signals as a function of the relative delay between the first and second optical pulse signals. Another embodiment uses the TPA count to achieve synchronization of a second optical pulse signal to a first optical pulse signal.
REFERENCES:
patent: 2002/0156592 (2002-10-01), Taira et al.
K. Kikuchi, F. Futami and K. Katah. Highly sensitive and compact cross-correlator for measurement of picosecond pulse transmission characteristics at 1550nm using two-photon absorption in Si avalanche photodiode. Electronics Letters. vol. 34, No. 22.
K. Kikuchi; Highly sensitive interferometics autocorrelator using Si avalanche photodiode as two-photon absorber; Jan. 8, 1998;Electronics Letters, vol. 34, No. 1.
K. Kitkuchi; Optical sampling system at 1.5μm using two photon absorption in Si avalanche; Jun. 25, 1998;Electronics Letters, vol. 34, No. 13.
S. Cova et al; Avalanche photodiodes and quenching circuits for single-photon detection; Apr. 20, 1996;Applied Optics, vol. 35, No. 12.
Knox Wayne Harvey
Roth Jeffrey M.
Xu Chunhui
Lee David
Lucent Technologies - Inc.
Sedighian M. R.
LandOfFree
Dynamic measurement of and compensation for impairments to... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dynamic measurement of and compensation for impairments to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic measurement of and compensation for impairments to... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3564328