Dynamic laser speckle profilometer and method

Details Dynamic laser speckle profilometer and method Dynamic laser speckle profilometer and method

1989-09-06

1991-06-04

Willis, Davis L.

Optics: measuring and testing

Material strain analysis

By light interference detector

356354, G01B 902

Patent

active

050209043

ABSTRACT:
A Dynamic Laser Speckle Profilometer (DLSP) apparatus and method are provided to preform nondestructive analysis of materials, components, and assemblies by creating an optoelectronic phase map. This phase map is used to generate the deformation and resonance mode mapping of an object under test. The Dynamic Laser Speckle Profilometer system is based upon the low optical noise design of a double pulsed laser speckle interferometer incorporating a single frequency polarized laser, a high bandwidth amplitude modulator, a phase modulator, a phase tracker, a range finder, and a light sensitive surface, all under computer control. This produces a series of interference images of an object under test. The dynamic laser speckle profilometer method uses a series of interference images, the Carre' phase algorithm, and recursive speckle elimination, to produce phase maps of the object under test. The method uses a series of phase maps, and an absolute phase calculation to produce deformation maps and resonance mode maps of the object under test. Additional post processing is used to produce displacement maps, stress and strain maps, and bending moments, all of which are desirable for verification of finite elemental analysis of materials, components, and assemblies.

REFERENCES:
patent: 4913550 (1990-04-01), Montgomery et al.

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