Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1989-04-10
1990-11-27
Cuchlinski, Jr., William A.
Geometrical instruments
Gauge
Movable contact probe, per se
33558, G01B 500
Patent
active
049725947
ABSTRACT:
A piezo-controlled dynamic probe or feeler head for measuring installations and measuring machine, which is in an operative connection with a measurement evaluating or plotting unit and, selectively with a measuring machine control. The probe is constructed from two mutually independently operating measuring signal generating installations, which are equipped with mutually separate or independent circuits and which act in such a manner on the measuring evaluating or plotting unit and, selectively, on the measuring machine control, that upon the generation of a signal from the first measuring signal generating installation, stored data regarding the position of the probe can be recognized as being valid only at the presence of a confirmation or acknowledging signal from the second measuring signal generating installation.
REFERENCES:
patent: 4177568 (1979-12-01), Werner et al.
patent: 4701659 (1987-10-01), Fujii et al.
patent: 4769919 (1988-09-01), Lloyd et al.
patent: 4785545 (1988-11-01), Aubebe
patent: 4816713 (1989-03-01), Change, Jr.
patent: 4823802 (1989-04-01), Romanovskaya
patent: 4833792 (1989-05-01), Achnelt et al.
Gurny Werner
Hausler Eberhard
Cuchlinski Jr. William A.
Wegu-Messtechnik GmbH
Wirthlin Alvin
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