Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-09-04
2007-09-04
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
11016278
ABSTRACT:
A method and apparatus are disclosed. The apparatus includes a store of at least one historical sensor measurement, a store of potential cut-off frequencies, and a filter. Each potential cut-off frequency is associated with a respective potential difference between a sensor measurement and the stored historical sensor measurement. The filter has a cut-off frequency dynamically selected from the stored potential cut-off frequencies on the basis of a difference between the stored historical sensor measurement and a current sensor measurement. The method includes determining a difference between a current sensor measurement and a historical sensor measurement; and dynamically selecting a cut-off frequency for a filter for the current sensor measurement from the difference.
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Mirkovic Vesna R.
Sun Hongqiao
Wheat W. Spencer
Bui Bryan
Patangia Melissa
Texaco Inc.
Turner Frank C
Williams, Morgan & Amerson PC
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