Dynamic control system for manufacturing processes including...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C700S029000, C700S033000, C700S044000, C700S103000, C702S182000, C706S021000

Reexamination Certificate

active

07840297

ABSTRACT:
Methods, apparatuses and systems that facilitate the design, production, control and/or measurement tasks associated with manufacturing and other processes. In one implementation, the present invention facilitates or enables the use of indirect process variables for use in manufacturing or other processes that yield articles or parts. For example, it enables determining a desired value profile for an indirect process variable based on the operating target, the lower operating limit and the upper operating limit for the predictor characteristic, and observations of the process. In one implementation, the present invention facilitates qualifying articles resulting from the process by comparing the desired versus observed value profiles for an indirect process variable. In another implementation, the present invention facilitates controlling a direct process variable based on the observed versus desired values of an indirect process variable.

REFERENCES:
patent: 5136686 (1992-08-01), Koxa
patent: 5442562 (1995-08-01), Hopkins et al.
patent: 5546312 (1996-08-01), Mozumder et al.
patent: 5661669 (1997-08-01), Mozumder et al.
patent: 5778151 (1998-07-01), Gramckow et al.
patent: 5850339 (1998-12-01), Giles
patent: 6311096 (2001-10-01), Saxena et al.
patent: 6326160 (2001-12-01), Dunn et al.
patent: 6370437 (2002-04-01), Carter et al.
patent: 6397114 (2002-05-01), Erurek et al.
patent: 6424876 (2002-07-01), Cusson et al.
patent: 6442445 (2002-08-01), Bunkofske
patent: 6567752 (2003-05-01), Cusumano et al.
patent: 6616759 (2003-09-01), Tanaka et al.
patent: 6687558 (2004-02-01), Tuszynski
patent: 6760632 (2004-07-01), Heching et al.
patent: 7072808 (2006-07-01), Tuszynski
patent: 7627171 (2009-12-01), Hampshire et al.
patent: 7680635 (2010-03-01), Keeton et al.
patent: 2004/0167648 (2004-08-01), Tuszynski
patent: 2005/0055110 (2005-03-01), Tuszynski
patent: 2005/0119865 (2005-06-01), Bartsch
patent: 2006/0178862 (2006-08-01), Chan et al.
patent: 2008/0162100 (2008-07-01), Landa
U.S. Appl. No. 11/384,749, Tuszynski, filed Mar. 20, 2006.
Dr. Werner Stahel: “Statistiche Datenanalyse,” Dec. 31, 2000, Friedr. Viewg & Sohn Verlagsgesellscheft, Braunschweig/Wiesbaden, XP002325712, pp. 260-294.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Dynamic control system for manufacturing processes including... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dynamic control system for manufacturing processes including..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic control system for manufacturing processes including... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4191523

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.