Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With gas inlet structure
Reexamination Certificate
2011-08-02
2011-08-02
Kackar, Ram (Department: 1716)
Adhesive bonding and miscellaneous chemical manufacture
Differential fluid etching apparatus
With gas inlet structure
C118S715000, C216S058000, C428S066400, C222S001000, C222S003000, C137S002000
Reexamination Certificate
active
07988813
ABSTRACT:
A method and system for dynamically controlling a process chemistry above a substrate is described. The system for adjusting the process chemistry comprises a ring configured to surround a peripheral edge of a substrate in a vacuum processing system. The ring comprises one or more gas distribution passages formed within the ring and configured to supply an additive process gas through an upper surface of the ring to the peripheral region of the substrate, wherein the one or more gas distribution passages are configured to be coupled to one or more corresponding gas supply passages formed within the substrate holder upon which the ring rests.
REFERENCES:
patent: 5620523 (1997-04-01), Maeda et al.
patent: 5637146 (1997-06-01), Chyi
patent: 6090210 (2000-07-01), Ballance et al.
patent: 6473993 (2002-11-01), Yagi et al.
patent: 6492612 (2002-12-01), Taguchi et al.
patent: 6740853 (2004-05-01), Johnson et al.
patent: 7064812 (2006-06-01), Ludviksson et al.
patent: 2003/0124820 (2003-07-01), Johnsgard et al.
patent: 2006/0090855 (2006-05-01), Kimura
patent: 2006/0100824 (2006-05-01), Moriya
patent: 2006/0207507 (2006-09-01), Oohashi et al.
patent: 2007/0040265 (2007-02-01), Umotoy et al.
patent: 2002-217171 (2002-08-01), None
patent: 02/086957 (2002-10-01), None
patent: 02084710 (2002-10-01), None
patent: 2008075340 (2008-06-01), None
European Patent Office, Search Report and Written Opinion, from related PCT/US2008/056478, dated Dec. 4, 2008.
Chen Lee
Funk Merritt
Sundararajan Radha
Chandra Satish
Kackar Ram
Tokyo Electron Limited
Wood Herron & Evans LLP
LandOfFree
Dynamic control of process chemistry for improved... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dynamic control of process chemistry for improved..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic control of process chemistry for improved... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2724630