Dynamic burn-in method and apparatus

Details Dynamic burn-in method and apparatus Dynamic burn-in method and apparatus

2006-04-04

2006-04-04

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07023228

ABSTRACT:
In a dynamic burn-in apparatus wherein a signal output from a signal generator is input to a semiconductor device to be tested in the burn-in tank, a converter is arranged at the output of the signal generator. The converter increases, by N times, the frequency of the signal output from a signal generator. The signal having the increased frequency and output from the converter, is input to the semiconductor device to be tested in the burn-in tank when the burn-in is operated at high-speed. The frequency of the signal is converted to the higher frequency, and the signal having the higher frequency is provided to the semiconductor device. As the result, the burn-in can be done in a shorter time for a high-speed sophisticated semiconductor device.

REFERENCES:
patent: 5798653 (1998-08-01), Leung, Jr.
patent: 5825193 (1998-10-01), Nakata et al.
patent: 6518779 (2003-02-01), Nakata et al.
patent: 5-258599 (1993-10-01), None
patent: 10-221411 (1998-08-01), None
patent: 2000-123595 (2000-04-01), None

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