Duty cycle measurement apparatus and method

Details Duty cycle measurement apparatus and method Duty cycle measurement apparatus and method

2007-08-21

2007-08-21

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S176000

Reexamination Certificate

active

11260570

ABSTRACT:
A mechanism for measuring duty cycle of a signal under test in an integrated circuit device, such as a microprocessor or system-on-a-chip is provided. The mechanism generates a frequency which is proportional to the duty cycle and which can be measured using common lab or manufacturing equipment. The mechanism may be implemented using simple circuits in a standard complementary metal oxide semiconductor process which requires very little area and can be powered off when it is not being used. The mechanism may include, for example, a low pass filter, a voltage divider for providing calibration reference voltage signals, a voltage to frequency converter, a frequency divider for dividing a frequency signal output so that the frequency of the signal is within a predetermined range, and an output driver and output pad. From the frequency output signal, a duty cycle of the signal under test may be calculated using off-chip equipment.

REFERENCES:
patent: 2004/0095113 (2004-05-01), Kernahan et al.
U.S. Appl. No. 10/970,284, filed Oct. 21, 2004, Boerstler et al.

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