Duty cycle error calculation circuit for a clock generator...

Details Duty cycle error calculation circuit for a clock generator... Duty cycle error calculation circuit for a clock generator...

2008-09-09

2008-09-09

Tra, Quan (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Rectangular or pulse waveform width control

C327S172000

Reexamination Certificate

active

11341062

ABSTRACT:
A system and method for generating a correction signal for correcting duty cycle error of a first clock signal relative to a second complementary clock signal. Changes to a time difference between high- and low-portions of the first clock signal are detected and the correction signal is generated in response to and accordance with the detected changes.

REFERENCES:
patent: 4527075 (1985-07-01), Zbinden
patent: 5170416 (1992-12-01), Goetz et al.
patent: 5572158 (1996-11-01), Lee et al.
patent: 5614855 (1997-03-01), Lee et al.
patent: 5727037 (1998-03-01), Maneatis
patent: 5757218 (1998-05-01), Blum
patent: 5781055 (1998-07-01), Bhagwan
patent: 5828250 (1998-10-01), Konno
patent: 5945857 (1999-08-01), Havens
patent: 6040726 (2000-03-01), Martin
patent: 6052152 (2000-04-01), Malcolm, Jr. et al.
patent: 6084452 (2000-07-01), Drost et al.
patent: 6125157 (2000-09-01), Donnelly et al.
patent: 6137328 (2000-10-01), Sung
patent: 6169434 (2001-01-01), Portmann
patent: 6181178 (2001-01-01), Choi
patent: 6194916 (2001-02-01), Nishimura et al.
patent: 6198326 (2001-03-01), Choi et al.
patent: 6201423 (2001-03-01), Taguchi et al.
patent: 6275555 (2001-08-01), Song
patent: 6282253 (2001-08-01), Fahrenbruch
patent: 6285226 (2001-09-01), Nguyen
patent: 6298004 (2001-10-01), Kawasaki et al.
patent: 6310653 (2001-10-01), Malcolm, Jr. et al.
patent: 6320438 (2001-11-01), Arcus
patent: 6342801 (2002-01-01), Shin
patent: 6384652 (2002-05-01), Shu
patent: 6426660 (2002-07-01), Ho et al.
patent: 6433597 (2002-08-01), Jung
patent: 6441659 (2002-08-01), Demone
patent: 6445228 (2002-09-01), Nguyen
patent: 6452432 (2002-09-01), Kim
patent: 6459314 (2002-10-01), Kim
patent: 6466071 (2002-10-01), Kim et al.
patent: 6496045 (2002-12-01), Nguyen
patent: 6498524 (2002-12-01), Kawasaki et al.
patent: 6507220 (2003-01-01), Groen et al.
patent: 6535040 (2003-03-01), Jung et al.
patent: 6539072 (2003-03-01), Donnelly et al.
patent: 6542015 (2003-04-01), Zhou et al.
patent: 6578154 (2003-06-01), Wynen et al.
patent: 6580305 (2003-06-01), Liu et al.
patent: 6583657 (2003-06-01), Eckhardt et al.
patent: 6603337 (2003-08-01), Cho
patent: 6605969 (2003-08-01), Mikhalev et al.
patent: 6625765 (2003-09-01), Krishnan
patent: 6628276 (2003-09-01), Elliott
patent: 6643790 (2003-11-01), Yu et al.
patent: 6677792 (2004-01-01), Kwak
patent: 6690218 (2004-02-01), Goldblatt
patent: 6711226 (2004-03-01), Williams et al.
patent: 6737927 (2004-05-01), Hsieh
patent: 6744289 (2004-06-01), Nguyen et al.
patent: 6750688 (2004-06-01), Takai
patent: 6765421 (2004-07-01), Brox et al.
patent: 6765976 (2004-07-01), Oh
patent: 6768697 (2004-07-01), Labrum et al.
patent: 6788120 (2004-09-01), Nguyen
patent: 6794913 (2004-09-01), Stengel
patent: 6801067 (2004-10-01), Jang
patent: 6801072 (2004-10-01), Guinea et al.
patent: 6819155 (2004-11-01), Ling et al.
patent: 6853225 (2005-02-01), Lee
patent: 6859107 (2005-02-01), Moon et al.
patent: 6873199 (2005-03-01), Nishimura et al.
patent: 6876240 (2005-04-01), Moon et al.
patent: 6879923 (2005-04-01), Butler
patent: 6882196 (2005-04-01), Yee et al.
patent: 6917230 (2005-07-01), Miller
patent: 6920081 (2005-07-01), Labrum et al.
patent: 6924684 (2005-08-01), Nguyen
patent: 6927642 (2005-08-01), Hsieh
patent: 6934215 (2005-08-01), Chung et al.
patent: 6940328 (2005-09-01), Lin
patent: 6958639 (2005-10-01), Park et al.
patent: 6963235 (2005-11-01), Lee
patent: 6982581 (2006-01-01), Dosho et al.
patent: 7005900 (2006-02-01), Nguyen
patent: 7005904 (2006-02-01), Minzoni
patent: 7015739 (2006-03-01), Lee et al.
patent: 7019574 (2006-03-01), Schrodinger
patent: 7020228 (2006-03-01), Miyano
patent: 7039147 (2006-05-01), Donnelly et al.
patent: 7046059 (2006-05-01), Kwak
patent: 7075856 (2006-07-01), Labrum et al.
patent: 7078949 (2006-07-01), Kim et al.
patent: 7098714 (2006-08-01), Lin
patent: 7116141 (2006-10-01), Demone
patent: 7116143 (2006-10-01), Deivasigamani et al.
patent: 7116149 (2006-10-01), Kim
patent: 7119594 (2006-10-01), Kim
patent: 7120839 (2006-10-01), Fayneh et al.
patent: 2003/0080791 (2003-05-01), Fiscus
patent: 2004/0113667 (2004-06-01), Jin
patent: 2005/0028019 (2005-02-01), Kim
patent: 2005/0262373 (2005-11-01), Kim
patent: 2005/0270893 (2005-12-01), Lin et al.
patent: 2006/0044931 (2006-03-01), Kim
patent: 2006/0045227 (2006-03-01), Guan
patent: 2006/0103440 (2006-05-01), Easwaran
patent: 2007/0086267 (2007-04-01), Kwak

Affiliated with

Also associated with

Rating

Duty cycle error calculation circuit for a clock generator... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Duty cycle error calculation circuit for a clock generator..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Duty cycle error calculation circuit for a clock generator... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3929467