Dual-wavelength spectrophotometry system

Details Dual-wavelength spectrophotometry system Dual-wavelength spectrophotometry system

1987-03-09

1989-01-03

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrophotometer

356318, 356325, G01J 308, G01J 3427, G01N 2164

Patent

active

047952563

ABSTRACT:
A dual wavelength spectrophotometer produces a relatively small, high power, high duty cycle light spot from a single relatively low power multi-chromatic light source. A Xenon arc lamp light source is focused by an ellipsoidal mirror onto a rotating partially reflective optical chopper. The chopper comprises a wheel having mirrored segments alternately separated by transparent segments. Light reflected by the mirrored segments passes through a first monochromator which produces a first monochromatic light beam. Light transmitted through the transparent segments passes through a second monochromator and emerges as a second monochromatic light beam having a wavelength different from the wavelength of said first monochromatic light beam. The first and second monochromatic light beams are recombined into a single dual wavelength light beam that is reflected through a sample to be analyzed. Reflective front surfaces are employed throughout the system in order to minimize power loss.

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patent: 4455097 (1984-06-01), Ichikawa et al.
patent: 4484815 (1984-11-01), Akiyama et al.

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