Dual wavelength holographic interferometry system and method

Details Dual wavelength holographic interferometry system and method Dual wavelength holographic interferometry system and method

1988-01-29

1989-03-07

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356361, G01B 9025

Patent

active

048100943

ABSTRACT:
The present invention relates to a two-wave holographic interferometry system and method. In such systems, a reference beam holographic is super-imposed on an object beam, the object beam being an image obtained by passing a beam through an object regarding which some parameter (e.g. temperature gradient) is to be measured. A photograph (50) of the superimposed beams (D) is taken. The present invention employs two object (B) and two reference (A) beams and the invention is particularly concerned with the use of a prism assembly (C) which causes the two different wavelengths (W1, W2) of the object beams to emerge from the prism at slightly different angles, thereby providing two holographic images which are slightly displaced from each other.

REFERENCES:
patent: 3758187 (1973-09-01), Thomas et al.
patent: 3802758 (1974-04-01), Havener et al.
patent: 3860346 (1975-01-01), Kersch et al.
patent: 4428675 (1984-01-01), Witherow
patent: 4597630 (1986-07-01), Brandsetter et al.

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