Dual trace automatic eddy current detection system for multilaye

Details Dual trace automatic eddy current detection system for multilaye Dual trace automatic eddy current detection system for multilaye

1978-12-08

1981-05-19

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324219, G01V 3312

Patent

active

042687918

ABSTRACT:
An automatic eddy current probe is revolved in a hole to be inspected, the output of the probe is divided to provide two signals to a recorder, a filtered signal will indicate the presence or absence of a flaw, a non filtered signal indicates probe position, this is particularly valuable when scanning through several structural layers.

REFERENCES:
patent: 3056081 (1962-09-01), Hochschild
patent: 3401332 (1968-09-01), McClurg et al.
patent: 3538433 (1970-11-01), Wood et al.
patent: 3718855 (1973-02-01), Rogel et al.
patent: 3737764 (1973-06-01), Dufayet
patent: 4083002 (1978-04-01), Allport
patent: 4117403 (1978-09-01), Forster et al.

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