Dual tip probe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

active

10970192

ABSTRACT:
A locking mechanism and method for selectively fixing and allowing movement of a tip portion of a probe relative to a rigid portion of the probe are provided. The mechanism comprises a locking ball joint for selectively locking and allowing relative movement between the tip portion and the rigid portion and a sleeve about the ball joint. The locking ball joint is locked by the placement of the sleeve in a first position, thereby fixing the position of the tip portion relative to the rigid portion, and released by the placement of the sleeve in a second position, thereby allowing movement of the tip portion relative to the rigid portion.

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patent: 6838893 (2005-01-01), Khandros et al.
patent: 6949919 (2005-09-01), Cannon

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