Dual technology optical profilometer

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Reexamination Certificate

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07636167

ABSTRACT:
The device comprises a light source (LED), beam splitters, illumination pattern generating mechanism and interchangeable microscope lenses that are lenses that may be used to obtain confocal images and lenses that may be used to obtain interferometric images. The generating mechanism can generate a sequence of illumination patterns to obtain confocal images, or total opening of all the illumination pixels to obtain interferometric images.

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patent: WO 01/42735 (2001-06-01), None
Roger Artigas et al., Three-dimensional Micromeasurements On Smooth And Rough Surfaces With A New Confocal Optical Profiler, Part of the Europto Conference on Optical Measurement Systems for Industrial Inspection, Jun. 1999, SPIE vol. 3824, Munich, Germany. (XP-002334081).
Adrian G. Podoleanu et al., Sequential Optical Coherence Tomography and Confocal Imaging, Optics Letters, © 2004 Optical Society of America, Feb. 15, 2004, vol. 29, No. 4. (XP-002334082).
Roger Artigas et al., Dual-technology Optical Sensor Head for 3D Surface Shape Measurements on the Micro and Nano-Scales, Optical Metrology In Production Engineering, Proc of SPIE, 2004, vol. 5457, Bellingham, WA. (XP-002334080).
Written Opinion of the International Searching Authority, dated Jul. 14, 2005.
International Search Report, dated Jul. 14, 2005.
Cadevall, Cristina et al., “Improving the Measurement of Thick and Thin Films with Optical Profiling Techniques”, Proceedings SPIE, vol. 6616, pp. 66161Z-1-661612-12 (2007).
Cadevall, Cristina, “Chapter 3—New Optical Imagining Profiler: Design and Applications”, PhD Supervisors: F. Laguarta and R. Artigas, PhD Degree awarded by Technical University of Catalonia (UPC) Mar. 26, 2007.

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