Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-03-11
2008-03-11
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S061000, C702S079000, C702S178000, C702S187000, C340S870110
Reexamination Certificate
active
11176937
ABSTRACT:
A dual source real time clock (RTC) synchronization system and method for implementation within automatic meter reading (AMR) systems that provide system-wide device time synchronization. In one embodiment, a microcontroller-implemented RTC counts elapsed seconds from a pre-determined system timestamp using a low-speed, low-accuracy crystal. A second source is used to compensate for the low-speed, low-accuracy crystal. This second source comprises a high speed clock in one embodiment. This dual source RTC system can synchronize the endpoint device.
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Nagy Christopher J.
Osterloh Christopher L.
Itron, Inc.
Patterson Thuente Skaar & Christensen P.A.
Wachsman Hal
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