Dual source data distribution system for integrated circuit test

Details Dual source data distribution system for integrated circuit test Dual source data distribution system for integrated circuit test

1997-04-28

1998-11-17

Canney, Vincent P.

Excavating

G06F 1100

Patent

active

058386947

ABSTRACT:
An integrated circuit (IC) tester employs both central and distributed data sources for controlling tester operation during a test. The tester includes a master controller, a central scan data source, and a set of tester nodes. Each tester node carries out a sequence of test actions at an IC terminal, each action being defined by a data word (test vector). Before the test sets of vectors are written into vector memories in the nodes and separate control data is loaded into registers in each node. During the test, the scan data source sends scan data words concurrently to all tester nodes, and each node stores them. The master controller sends a similar instruction to each tester node during each cycle of the test. Some instructions reference a vector stored in the node and instruct all tester nodes to carry out the action indicated by the referenced vector. Other instructions tell the tester nodes to alter a last read vector by replacing selected bits of the referenced vector with selected bits of a stored scan data word and then to carry out an action indicated by the altered vector. The control data tells each tester node which bits of the vector (if any) to replace and which bits of the scan data word are used as replacements. The scan data controls node operations during portions of a test when only a few nodes are actively changing their activities at their IC terminals from cycle to cycle.

REFERENCES:
patent: 4862067 (1989-08-01), Brune et al.
patent: 4931723 (1990-06-01), Jeffrey et al.
patent: 4994732 (1991-02-01), Jeffrey et al.

Affiliated with

Also associated with

Rating

Dual source data distribution system for integrated circuit test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dual source data distribution system for integrated circuit test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual source data distribution system for integrated circuit test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-892265