Thermal measuring and testing – Emissivity determination
Patent
1983-02-14
1986-04-01
Yasich, Daniel M.
Thermal measuring and testing
Emissivity determination
250340, 250571, 364571, 374126, 374173, G01J 532, G01N 2520
Patent
active
045794618
ABSTRACT:
A pyrometer for determining the temperature of a surface in the presence of reflected radiation has two infrared radiation sensors, each responsive to different wave length, positioned to receive radiation from the surface. An adjustment factor is developed from sensor response signals when reflected radiation and surface temperatures are the same, and is combined with sensor response characteristics over a range of surface and sensor indicated temperatures to develop a correction factor which when multiplied by the indicated temperature provides the actual surface temperature.
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"Mass Scale Linearizer", IBM Tech. Bulletin, A. Halperime et al. pp. 1581-1582, (vol 10, #10, 1968).
Carney John F.
United States Steel Corporation
Yasich Daniel M.
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