Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Reexamination Certificate
2007-10-09
2007-10-09
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
C360S073030, C360S097020, C360S069000, C360S071000, C360S075000
Reexamination Certificate
active
10933992
ABSTRACT:
A system for precisely determining a position with resolution on the order of nanometers or sub-nanometers is described. In particular, a system is described that utilizes a first and a second sensor assembly to determine a position of a movable element over a distance many times the capable range of operation of either of the individual sensor assemblies. The two sensor assemblies leap-frog one another in an incremental fashion to ensure that at least one of the sensor assemblies is always within it operational range. Positional signals generated by one of the sensor assemblies can be used to calibrate the other sensor assembly, following an adjustment of the other sensor assembly. The described invention may be implemented in an optical storage disk mastering system to determine the position of mastering optics as the mastering optics translate over the surface of a storage master disk.
REFERENCES:
patent: 6067203 (2000-05-01), Ottesen et al.
patent: 6352399 (2002-03-01), Martin et al.
Barlow John
Imation Corp.
Kundu Sujoy
Levinson Eric D.
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