Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1981-10-15
1984-02-28
McGraw, Vicent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356351, G01C 1964
Patent
active
044339151
ABSTRACT:
A dual polarization interferometer is employed for use as an angular rate sensor. A single waveguide is provided for propagating wave components of each of two polarized waves traveling in opposite directions. Each wave traveling through the waveguide is phase shifted by a value related to the rotation rate of the waveguide.
Honeywell Inc.
McGraw Vicent P.
Pajak Robert A.
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