Data processing: measuring – calibrating – or testing – Calibration or correction system – Temperature
Reexamination Certificate
2006-08-04
2008-12-30
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Temperature
C702S130000, C702S136000, C323S311000, C323S313000, C323S315000, C323S907000, C700S275000, C700S276000, C700S277000, C700S278000
Reexamination Certificate
active
07472030
ABSTRACT:
In a system for performing a dual mode single temperature trim upon an electronic device to remove combined mismatch and process variation errors, a dynamic element matching control is configured for enabling dynamic element matching of components of the electronic device. A process trim module is configured for performing a process trim to remove a temperature dependant error from the electronic device while the dynamic element matching is enabled within the electronic device. A mismatch trim module is configured for performing a mismatch trim to remove a mismatch error from the electronic device after the process trim has been performed. The mismatch trim is performed on a portion of the electronic device for which the dynamic element matching has been disabled. Additionally, the mismatch trim is performed at substantially an equivalent temperature to a temperature at which the process trim was performed.
REFERENCES:
patent: 5621307 (1997-04-01), Beggs
patent: 6011422 (2000-01-01), Koglin
patent: 6591210 (2003-07-01), Lorenz
patent: 1337037 (2003-08-01), None
Kundu Sujoy K
Lau Tung S
National Semiconductor Corporation
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