Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1996-05-28
1997-03-11
Epps, Georgia Y.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
356384, 356136, 356378, G01N 2100
Patent
active
056107102
ABSTRACT:
A dual mode illumination system for optical inspection of products for surface defects and defects in holes in the product includes a first light source for providing illumination along an axis of one or more holes in the product to be inspected, the first light source being positioned on a first side of the product, a second light source providing illumination of the surface of the second side of the product to be inspected, a beam splitter for redirecting light from the second light source to a light sensor while passing light from the first light source to the light sensor. The second light source may be located adjacent to a second side of the product to be tested with the axis of illumination parallel to a major plane of the product. The light sensor may be a video camera connected to a data processing and display system.
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U.S. patent application Ser. No. 08/117,582 filed Sep. 2, 1993.
Canfield Donald H.
Fellows Todd C.
Gillis Earle W.
Yablonsky Peter J.
Epps Georgia Y.
International Business Machines - Corporation
Ratliff Reginald A.
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