Dual match line architecture for content addressable...

Static information storage and retrieval – Associative memories – Ferroelectric cell

Reexamination Certificate

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C365S189070, C365S204000, C711S108000, C711S118000

Reexamination Certificate

active

11141301

ABSTRACT:
A dual match line circuit may include precharge logic configured to precharge each of a hit match line, a miss match line and an evaluate node to an asserted state, where a coupling device couples the hit and miss match lines to the evaluate node. The miss match line may discharge through a number of load devices that may be activated by respective miss signals. The hit match line may be additionally coupled to discharge through a pair of devices connected in series, one of which may be activated by a hit signal, and the other of which may be activated by the miss match line. The hit and miss match lines may be electrically isolated from one another, such that when any of the respective miss signals is asserted, current from the hit match line does not discharge through the miss match line.

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Ho, et al., “A Process-Portable 64b Embedded Microprocessor with Graphics Extensions and a 3.6GB/S Interface,” International Solid-State Circuits Conference, ISSCC-2001, 3 pages.
Mohan, et al., “Low Power Dual Matchline Ternary Content Addressable Memory,” IEEE International Symposium on Circuits and Systems, (ISCAS), 2004, 4 pages.
U.S. Appl. No. 11/144,123, filed May 31, 2005.

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