Dual level test fixture

Details Dual level test fixture Dual level test fixture

1991-12-12

1993-05-25

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, 439482, G01R 1512, G01R 3122

Patent

active

052143740

ABSTRACT:
A test fixture with a single vacuum well and two vacuum chambers for use in the automatic testing of printed circuit boards is connected to an electronic circuit tester for performing high speed testing of circuits on the board. The fixture includes a vacuum well, two vacuum chambers formed by gaskets, a movable top plate for moving the circuit board and a stripper plate between two positions, and ar array of test probes disposed in the vacuum well for access to the circuit board. The board under test is placed on the test fixture and a first vacuum is drawn from the first vacuum chamber to move the plate, thereby engaging a first plurality of test probes with the board for performing functional tests. A second vacuum is drawn from the second vacuum chamber to move the printed circuit board to engage a second set of test probes. A second set of electrical test signals is communicated to both sets of test probes for a second in-circuit test.

REFERENCES:
patent: 4344033 (1982-08-01), Stowers et al.
patent: 4626776 (1986-12-01), Wilkinson
patent: 4626779 (1986-12-01), Boyle

Affiliated with

Also associated with

Rating

Dual level test fixture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dual level test fixture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual level test fixture will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-900077