Image analysis – Histogram processing – For setting a threshold
Patent
1986-12-23
1991-02-12
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 14, 382 34, G06K 970
Patent
active
RE0335363
ABSTRACT:
A pattern recognition system has both coarse and fine levels of analysis in which a coarse array representation of a workpiece pattern is formed and used to identify the workpiece pattern as either a reference character or as a member of an ambiguous set of reference characters which are represented by identical coarse array representations. At least portions of a fine array representation of a workpiece pattern which has been classified as a member of a set of reference characters are compared to corresponding portions of fine array representations of reference characters in the set identified by the classification. The pattern recognition system has a learning system through which reference characters may be introduced into the recognition system and through which a representation of a workpiece pattern which was not identified may be incorporated into an existing set of reference characters of the recognition system.
REFERENCES:
patent: 3182290 (1965-05-01), Rabinow
patent: 3829831 (1974-08-01), Yamamoto et al.
patent: 3967241 (1976-06-01), Kawa
patent: 4027284 (1977-05-01), Hoshino et al.
Yamamoto, et al., "Chinese Char. Rec. by Hierarchical Pattern Matching", Proc. of the 1st Int. Conf. on Pattern Rec., Oct. 1973, pp. 187-196.
Boudreau Leo H.
Milik Kenneth L.
Shanahan Michael H.
Wang Laboratories, Inc.
LandOfFree
Dual level pattern recognition system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dual level pattern recognition system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual level pattern recognition system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-11707