Dual laser system for extended heterodyne interferometry

Details Dual laser system for extended heterodyne interferometry Dual laser system for extended heterodyne interferometry

1998-11-05

2000-04-18

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356350, G01B 902

Patent

active

060521864

ABSTRACT:
The present invention is a laser system (10, 100, 200) employing paired simple lasers (12, 16) or paired Zeeman type lasers (102, 112 or 202, 204). Systems of beambenders (20, 108, 210, 212, 214), half-wave plates (106, 116), and polarizing beamsplitters (22, 104, 114, 118, 216) pair the frequency component of one laser (12, 16, 102, 112, 202, 204) with that of another to produce one or more measurement beams (24, 150, 160, 228, 230) having orthogonally polarized frequency components. Systems of beamsplitters (26, 120, 124, 218, 220) and photodetectors (30, 122, 126, 206, 208) provide reference information about the frequency difference (196, 198) between the respective frequency components in the measurement beams (24, 150, 160, 228, 230). The frequency difference (196, 198) is tunable across a wide range, specifically including 4 MHz to 40 MHz when the lasers (12, 16, 102, 112, 202, 204) are conventional He--Ne types.

REFERENCES:
patent: 4006989 (1977-02-01), Andringa
patent: 4907886 (1990-03-01), Dandliker
patent: 4912530 (1990-03-01), Bessho
patent: 5784161 (1998-07-01), Bechstein et al.

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