Optics: measuring and testing – By polarized light examination
Patent
1999-01-04
2000-08-08
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
356369, 359834, 359496, G01J 400
Patent
active
061009814
ABSTRACT:
A retarder system, for entering retardation between orthogonal components of an electromagnetic beam of radiation, having first and second triangular shaped elements arranged so that the first triangular shaped element, as viewed in side elevation, presents with first and second sides which project to the left and right and downward from an upper point, with a third side which is oriented essentially horizontally and is continuous with, and present below the first and second sides; and so that the second triangular shaped element, as viewed in side elevation, presents with first and second sides which project to the left and right and upward from a lower point, with a third side which is oriented essentially horizontally and is continuous with, and present above the first and second sides. During use in a spectroscopic ellipsometer/polarimeter system, a beam of electromagnetic radiation exits in a propagation direction which is essentially undeviated and undisplaced from the direction of an incident beam of electromagnetic radiation, even when the retarder system is caused to rotate about the locus of the beam of electromagnetic radiation.
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Green Steven E.
Herzinger Craig M.
Johs Blaine D.
J.A. Woollam Co. Inc.
Pham Hoa Q.
Welch James D.
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