Dual gate BCMD pixel suitable for high performance CMOS...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Reexamination Certificate

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C257S004000

Reexamination Certificate

active

06882022

ABSTRACT:
A Dual Gate BCMD pixel has a compact size, nondestructive readout; complete reset with no kTC-reset noise generation, anti-blooming protection, and column reset capability. By incorporating a dual gate MOS transistor with an enclosed annular layout into the pixels of image sensing array, and sensing photo-generated charge nondestructively by detecting the transistor threshold voltage variations caused by collected charge, achieves this goal and other objects of the invention.

REFERENCES:
patent: 4556909 (1985-12-01), Yamada
patent: 5317174 (1994-05-01), Hynecek
patent: 5341008 (1994-08-01), Hynecek
patent: 5625210 (1997-04-01), Lee et al.

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