Optics: measuring and testing – By particle light scattering
Reexamination Certificate
2006-12-11
2009-02-24
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
By particle light scattering
C356S338000, C356S343000, C356S236000
Reexamination Certificate
active
07495763
ABSTRACT:
A measurement system having dual measurements capabilities is disclosed. The measurement system has a light source configured to provide light along a first axis that illuminates a sample media. The measurement system has a first sensor configured to measure scattered light in a sample media. The measurement system has a second sensor configured to measure light passing through the sample media.
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Hach Company
Stafira Michael P
The Ollila Law Group LLC
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