Dual emission microscope

Details Dual emission microscope Dual emission microscope

2008-06-18

2011-10-18

Consilvio, Mark (Department: 2872)

Optics: measuring and testing

By shade or color

C359S368000, C359S371000

Reexamination Certificate

active

08040513

ABSTRACT:
There is provided a microscope device comprising: means for creating a collimated beam of light collected from a sample and comprising at least a first spectral range and a second spectral range, means for separating the collimated beam into a first beam containing a higher percentage of light of the first spectral range than light of the second spectral range and a second beam containing a lower percentage of light of the first spectral range than light of the second spectral range, means for reflecting the first beam, means for reflecting the second beam, means for combining the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample on the detector, wherein the means for reflecting the first beam and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, wherein the means for reflecting the first beam is adapted to invert handedness of the first beam, and wherein the means for reflecting the second beam is adapted to preserve handedness of the second beam.

REFERENCES:
patent: 5337081 (1994-08-01), Kamiya et al.
patent: 5793523 (1998-08-01), Twisselmann
patent: 5963311 (1999-10-01), Craig et al.
patent: 6671089 (2003-12-01), Nishida et al.
patent: 6814484 (2004-11-01), Yano et al.
patent: 2004/0032650 (2004-02-01), Lauer
patent: 2006/0007343 (2006-01-01), Thomas
patent: 2004361391 (2004-12-01), None

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