Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2005-10-18
2005-10-18
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
Reexamination Certificate
active
06956653
ABSTRACT:
A dual electrooptic interferometer and method for operation thereof. In a preferred embodiment, the interferometer includes first and second electro-optically active optical waveguides; a first electrode substantially parallel to the first waveguide in a traveling wave modulator configuration; a second electrode substantially parallel to the second waveguide in a traveling wave modulator configuration; and a photo detector array optically coupled to the outputs of the waveguides.
REFERENCES:
patent: 4169980 (1979-10-01), Zanoni
patent: 4668093 (1987-05-01), Cahill
patent: 4747688 (1988-05-01), Geary
patent: 5172185 (1992-12-01), Leuchs et al
patent: 5710629 (1998-01-01), Kevorkian et al
patent: 6081335 (2000-06-01), Seki
Lam Lawrence Kwong
Van Eck Timothy Edwin
Lockheed Martin Corporation
McDermott Will & Emery LLP
Turner Samuel A.
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