Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-12-19
2006-12-19
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S073100, C324S1540PB
Reexamination Certificate
active
07151389
ABSTRACT:
A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit decouples the stress and monitor portions of the unit so that the requirements of each can be optimized. Deglitching and current clamp switches can be incorporated in the dual channel source measurement unit to prevent glitches in the switching circuitry and to limit or clamp current flow to or from the monitor and stress sources.
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International Search Report and Written Opinion in corresponding application PCT/US05/06951, mailed Apr. 17, 2006.
Borthwick James
Casolo Michael A.
Cuevas Peter P.
Raichman Tal
Beyer Weaver & Thomas LLP
Qualitau, Inc.
Tang Minh N.
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