Dual channel apparatus for detecting surface defects in elongate

Details Dual channel apparatus for detecting surface defects in elongate Dual channel apparatus for detecting surface defects in elongate

1978-11-22

1981-06-16

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With compensation for test variable

324237, G01N 2772, G01R 3300

Patent

active

042740541

ABSTRACT:
Inspection equipment for detecting defects in the surface of steel billets or other elongate members includes high-frequency energized eddy-current surface scanning probe which transmits signals representative of the surface condition and the probe surface spacing to a dual-channel receiver.
The signals from both channels of the receiver are combined to provide outputs representative of the surface condition compensating for changes in sensitivity resulting from changes in the probe spacing during scanning.
Probes may be positioned above the plane surfaces and/or the corners of the billet. The latter being positively located through rollers which bear against the two sides of the billet which flank the edge under inspection.

REFERENCES:
patent: 3585225 (1967-12-01), Peugoet
patent: 3611120 (1971-10-01), Forster
patent: 3714558 (1973-01-01), Swanepoel
patent: 3737764 (1973-06-01), Dufayet
patent: 3974442 (1976-08-01), Savidge et al.
Mandula, "Eddy Current Inspection of Semifinished Billets-Including Corners", Sep. 1970, Iron & Steel Engineer, pp. 85-92.
Hoffman, "A New Rotating Probe Eddy Current Method for Inspecting Bar Surface", Oct. 1975, Materials Evaluation, vol. 33, No. 10, pp. 237-242.

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