Dual beam tunable spectrometer

Details Dual beam tunable spectrometer Dual beam tunable spectrometer

1994-08-31

1995-12-19

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrophotometer

356325, 356327, 356369, 356446, 356447, 25033907, 25033911, G01J 342

Patent

active

054773210

ABSTRACT:
A dual beam tunable spectrometer comprises a radiation source, generating means, a detector, and a shutter arrangement. The radiation source generates an incident radiative beam. The generating means, which includes an acousto-optic tunable filter, receives the incident radiative beam and generates therefrom a reference beam and a sample beam. The detector detects at least part of the reference beam, and detects at least part of the sample beam emitted from a sample following illumination of the sample with the sample beam. The shutter arrangement includes a first shutter selectively permitting passage therethrough of the part of the reference beam and a second shutter selectively permitting passage therethrough of the part of the sample beam. The shutter arrangement opens the first shutter and closes the second shutter to permit the detector to detect only the part of the reference beam. Similarly, the shutter arrangement closes the first shutter and opens the second shutter to permit the detector to detect only the part of the sample beam.

REFERENCES:
patent: 4883963 (1989-11-01), Kemeny et al.
patent: 4890926 (1990-01-01), Dosmann et al.
patent: 5039855 (1991-08-01), Kemeny et al.
patent: 5198875 (1993-03-01), Bazin et al.
Tran, Chieu D., "Optical Elements for Spectroscopy," Analytical Chemistry, vol. 64, No. 20, pp. 971-981, Oct. 15, 1992.

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