Dual beam optical nulling interferometric spectrometer

Details Dual beam optical nulling interferometric spectrometer Dual beam optical nulling interferometric spectrometer

1989-07-31

1991-03-12

Turner, Samuel

Optics: measuring and testing

By particle light scattering

With photocell detection

G01B 902

Patent

active

049990101

ABSTRACT:
A dual beam Fourier transform spectrometer produces two beams from a single infrared (IR) source. The beams are directed through a sample region, with one beam transiting a sample and the other beam transiting a reference cell. The sample and reference beams are then directed to a Michelson interferometer with cube corner retroflectors for optically cancelling the background signal from the separate sample and reference beams and for optically combining the sample and reference beams in an optically accurate and stable manner. The single combined beam, which contains the difference interferogram is directed to a single detector.

REFERENCES:
patent: 2571937 (1951-10-01), Peck
patent: 3753619 (1973-08-01), Thorpe et al.
Dual-Beam Fourier Transform Infrared Spectrometer, Koehcetal, Analytical Chemestry, 3-1978, pp. 418-422.
A New Version of a Michelson Interferometer FTIR Spectroscopy, Genzel et al., Infrared Physics, 1978, pp. 113-120.

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