Dual-beam interferometer with a phase grating

Details Dual-beam interferometer with a phase grating Dual-beam interferometer with a phase grating

1995-02-24

1996-11-12

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356354, 356356, G01B 902

Patent

active

055745601

ABSTRACT:
An interferometer having a light source that generates a beam of light. The beam of light is directed to a beam splitter where it is split into a reference beam and a measuring beam. A pair of reflectors reflect the reference and measuring beams towards an interference point. A beam merging element is positioned at the interference point so that the reference and measuring beams interfere with each other at the interference point so that at least two pairs of partial beams which are phase-shifted in relation to each other and interfere with one another are generated. The two pairs of partial beams are received by a plurality of detectors which form directionally dependent measured values.

REFERENCES:
patent: 3090279 (1963-05-01), Chisholm
patent: 3547544 (1970-12-01), Steinemann et al.
patent: 3614235 (1971-10-01), Munnerlyn
patent: 4027976 (1977-06-01), Amon
patent: 5120132 (1992-06-01), Spies et al.

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