Dual beam Fourier spectrometer

Details Dual beam Fourier spectrometer Dual beam Fourier spectrometer

1977-09-06

1980-01-15

McGraw, Vincent P.

Optics: measuring and testing

By particle light scattering

With photocell detection

356307, G01B 902

Patent

active

041836693

ABSTRACT:
A dual beam Fourier-type spectrometer is disclosed incorporating distinct sample and reference beams which enter the Michelson-type interferometer on the same side of the beam splitter and propagate at slightly different angles through the interferometer. The portions of both beams which emerge from the side of the beam splitter opposite the input side are directed to two separate optical detectors, the outputs of which are electronically subtracted. In a preferred embodiment, the interferometer is of the refractively scanned type, wherein the increased field-of-view facilitates the use of beams having different propagation angles.

REFERENCES:
patent: 3684379 (1972-08-01), Girard
patent: 3753619 (1973-08-01), Thorpe et al.
patent: 4009962 (1977-03-01), Lauer et al.
patent: 4081215 (1978-03-01), Penny et al.
patent: 4084907 (1978-04-01), Pinard et al.
"Polarization Fourier Spectrometer for Astronomy;" A'Hearn et al.; Applied Optics; vol. 13, #5; May 74, pp. 1147-1157.

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